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21.
Charles J. Colbourn Sosina S. Martirosyan Gary L. Mullen Dennis Shasha George B. Sherwood Joseph L. Yucas 《组合设计杂志》2006,14(2):124-138
A covering array CA(N;t,k, v is an N × k array such that every N × t subarray contains all t‐tuples from v symbols at least once, where t is the strength of the array. Covering arrays are used to generate software test suites to cover all t‐sets of component interactions. The particular case when t = 2 (pairwise coverage) has been extensively studied, both to develop combinatorial constructions and to provide effective algorithmic search techniques. In this paper, a simple “cut‐and‐paste” construction is extended to covering arrays in which different columns (factors) admit different numbers of symbols (values); in the process an improved recursive construction for covering arrays with t = 2 is derived. © 2005 Wiley Periodicals, Inc. J Combin Designs 14: 124–138, 2006 相似文献
22.
A graph is called supereulerian if it has a spanning closed trail. Let G be a 2-edge-connected graph of order n such that each minimal edge cut SE(G) with |S|3 satisfies the property that each component of G−S has order at least (n−2)/5. We prove that either G is supereulerian or G belongs to one of two classes of exceptional graphs. Our results slightly improve earlier results of Catlin and Li. Furthermore, our main result implies the following strengthening of a theorem of Lai within the class of graphs with minimum degree δ4: If G is a 2-edge-connected graph of order n with δ(G)4 such that for every edge xyE(G) , we have max{d(x),d(y)}(n−2)/5−1, then either G is supereulerian or G belongs to one of two classes of exceptional graphs. We show that the condition δ(G)4 cannot be relaxed. 相似文献
23.
Let G=(V(G),E(G)) be a graph. A (n,G, λ)‐GD is a partition of the edges of λKn into subgraphs (G‐blocks), each of which is isomorphic to G. The (n,G,λ)‐GD is named as graph design for G or G‐decomposition. The large set of (n,G,λ)‐GD is denoted by (n,G,λ)‐LGD. In this work, we obtain the existence spectrum of (n,P3,λ)‐LGD. © 2002 Wiley Periodicals, Inc. J Combin Designs 10: 151–159, 2002; Published online in Wiley InterScience ( www.interscience.wiley.com ). DOI 10.1002/jcd.10008 相似文献
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Annegret K. Wagler 《Mathematical Methods of Operations Research》2002,56(1):127-149
An edge e of a perfect graph G is critical if G−e is imperfect. We would like to decide whether G−e is still “almost perfect” or already “very imperfect”. Via relaxations of the stable set polytope of a graph, we define two
superclasses of perfect graphs: rank-perfect and weakly rank-perfect graphs. Membership in those two classes indicates how
far an imperfect graph is away from being perfect. We study the cases, when a critical edge is removed from the line graph
of a bipartite graph or from the complement of such a graph. 相似文献
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Signed graphs for portfolio analysis in risk management 总被引:1,自引:0,他引:1
Harary Frank; Lim Meng-Hiot; Wunsch Donald C. 《IMA Journal of Management Mathematics》2002,13(3):201-210
We introduce the notion of structural balance for signed graphsin the context of portfolio analysis. A portfolio of securitiescan be represented as a signed graph with the nodes denotingthe securities and the edges representing the correlation betweenthe securities. With signed graphs, the characteristics of aportfolio from a risk management perspective can be uncoveredfor analysis purposes. It is shown that a portfolio characterizedby a signed graph of positive and negative edges that is structurallybalanced is characteristically more predictable. Investors whoundertake a portfolio position with all positively correlatedsecurities do so with the intention to speculate on the upside(or downside). If the portfolio consists of negative edges andis balanced, then it is likely that the position has a hedgingdisposition within it. On the other hand, an unbalanced signedgraph is representative of an investment portfolio which ischaracteristically unpredictable. 相似文献
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本文给出了一个关联图为圈的非负、半正定矩阵A为完全正的一个充要条件.我们还证明了这样的矩阵A(当A为完全正时)的分解指数即为A的阶数. 相似文献
30.
为了准确计算出镀膜过程中每层膜的折射率,介绍了实时监控过程中确定膜层折射率的2种方法:一种是由实测的透射比光谱直接反算出膜层的折射率;另一种是用最小二乘法的优化算法实时拟合折射率。试验结果表明:在线反算适合单点监控,所得折射率误差小于2%。然而在实际镀膜过程中,由于宽带内膜层参数误差较大,一般大于25%。为此,采用最小二乘法拟合,即在整个宽光谱范围内采集每个波长点的信息,所得结果误差很小,一般都在2%~5%之间,有时可达到10%,在很大程度上提高了实际镀膜时膜厚监控的精度。 相似文献